Hittech Wafer level sensor featured in Mikroniek
It is an honor that our high accuracy level sensor for wafers is featured of this month’s DSPE Mikroniek magazine. Our colleagues from development present the successful realization of a Mach Zehnder interferometer. A sound optics design, stable opto-mechanics and a smart vision approach led to a challenging and affordable level sensor, which was carried out in the framework of Hittech’s Technology Program. A nice example where we have combined our high-tech development and manufacturing experience to provide a cost efficient measurement solution for multiple wafer applications. If you are interested in our sensor development and production capabilities feel free to contact us.